39. ITG / GMM / GI - Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen - TuZ 2027

The workshop “Test Methods and Reliability of Circuits and Systems” is the most important german forum for discussing trends, results and current problems in the field of testing, diagnostics and reliability of digital, analog, mixed-signal and RF circuits. The world-wide exchange of ideas is an important concern of the workshop. International contributions from both industrial practice and research institutions are welcome. We welcome highly practice-related experience reports and results as well as contributions on theoretical topics from the following areas, among others:

• hardware-oriented test and hardware-oriented security
• fault tolerance, resilience, robust and radiation-hard systems
• dependability and functional safety
• adaptive systems (e.g. self-repair, self-healing, self-awareness)
• statistical and AI-learning for test and reliability
• automatic test-equipment, test automation, test programs and test modeling
• defect- and fault models
• diagnosis of failure causes
• test and simulation of mixed-Signal, HF- and analog-circuit-test •
• test generation, fault simulation, self-test and online-test
• test-oriented design, DfT methods
• test costs and quality
• test standards, e.g . IEEE 1149.x, IEEE 1687.x, IEEE 1838

General Chair
Görschwin Fey, Institute of Embedded Systems, Hamburg University of Technology (TUHH)

Program Chair 
Mario Schölzel, Department of Computer Science, Automation and Electronics, Hamburg University of Technology (TUHH)

IMPORTANT DATES & SUBMISSION

• Submission of Title & Abstract: November 1st 2026 
• Submission of Full Paper: November 9th 2026
• Author Notification: December 22nd 2026
• Camera-ready Paper: January 18th 2027  
   
• Submission-Page: https://easychair.org/conferences/?conf=tuz2027 
• Webpage: www.tuz2027.rp.es.tuhh.de