38. ITG / GMM / GI - Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen - TuZ 2026
| Beginn: | 22.02.2026 |
| Ende: | 24.02.2026 |
Potsdam
The workshop “Test Methods and Reliability of Circuits and Systems” is the most important german forum for discussing trends, results and current problems in the field of testing, diagnostics and reliability of digital, analog, mixed-signal and RF circuits. The world-wide exchange of ideas is an important concern of the workshop. International contributions from both industrial practice and research institutions are welcome. We welcome highly practice-related experience reports and results as well as contributions on theoretical topics from the following areas, among others:
- adaptive systems (e.g. self-repair, self-healing, self-awareness)
- automatic test-equipment, test automation, test programs and test modeling
- defect- and fault models
- diagnosis of failure causes
- fault tolerance, resilience, robust and raditation-hard systems
- functional safety
- hardware-oriented test and hardware-oriented Security
- statistical and AI-learning for test and reliability
- test and simulation of mixed-signal, HF- and analog-circuit-test
- test generation, fault simulation, selftest and online-test
- test-oriented design, DfT methods
- test costs and quality
- test standards, e.g . IEEE 1149.x, IEEE 1687.x, IEEE 1838
ITG Informationstechnische Gesells. im VDE
VDE/VDI-Ges. Mikroelektronik Mikrosystem- u. Feinwerktechnik
GI FA 3.5 / GMM FA 6.5/ ITG FA 8.2 RSS Kooperationsgemeinschaft Rechnergestützter Schaltungs- und Systementwurf
GI
VDE VDI GMM
VDE ITG
Important Dates
- Submission of Title & Abstract / November 9th 2025
- Submission of Full Paper / November 16th 2025
- Author Notification / December 22nd 2025
- Camera-ready Paper / January 18th 2026