The User Group Yield Enhancement was founded in 2004 and has been organized within the GMM expert committee.
In advance of each workshop, the members of the User Group define the two topics of discussion for the next meeting. Examples of those topics are : Wafer edge and backside engineering, Defect Equipment Monitoring, Zero defect strategy,….
Each company attending is asked to hold a short presentation on one of the two selected topics. The exchange of presentations, however, is not required.
In addition, a tool discussion session takes place within this 2 days' workshop. In this session, participating companies share their experiences on a particular tool without a formal presentation, rather than an intense discussion and exchange. The focus of the meeting is clearly on open technical discussions and informal information exchange.
The number of participants per company is not limited in order to give also new defect and yield engineers the chance of participating and learning from the whole European community of experts.
The User group is lead and moderated by M. Häuser, Infineon and I. Thurner, Convanit.
If you are interested in participating or if you need further information, please feel free to contact Ines Thurner, firstname.lastname@example.org